Method and apparatus for device access port selection

ABSTRACT

The disclosure describes a novel method and apparatuses for allowing a controller to select and access different types of access ports in a device. The selecting and accessing of the access ports is achieved using only the dedicated TDI, TMS, TCK, and TDO signal terminals of the device. The selecting and accessing of device access ports can be achieved when a single device is connected to the controller, when multiple devices are placed in a daisy-chain arrangement and connected to the controller, or when multiple devices are placed in a addressable parallel arrangement and connected to the controller. Additional embodiments are also provided and described in the disclosure.

This application is a divisional of application Ser. No. 13/891,840,filed May 10, 2013, currently pending;

Which was a divisional of application Ser. No. 13/628,802, filed Sep.27, 2012, now U.S. Pat. No. 8,468,406, issued Jun. 18, 2013;

Which is a divisional of application Ser. No. 13/272,697, filed Oct. 13,2011, U.S. Pat. No. 8,301,946, granted Oct. 30, 2012;

Which is a divisional of application Ser. No. 12/880,527, filed Sep. 13,2010, now U.S. Pat. No. 8,065,578, granted Nov. 22, 2011;

Which claims priority from Provisional Application No. 61/242,191, filedSep. 14, 2009.

FIELD OF THE DISCLOSURE

This disclosure relates to a method and apparatus for allowing theexternal interface signals of a device's 1149.1 Test Access Port to bere-used as interface signals to other types of access ports within thedevice.

BACKGROUND OF THE DISCLOSURE

Many electrical devices today, which may be ICs or embedded cores withinICs, include a JTAG (IEEE 1149.1) Test Access Port to provide access totest, debug, emulation, and/or programming circuitry within the device.One thing that makes the JTAG Test Access Port attractive for use in adevice is that its interface signals, consisting of a Test Data Input(TDI), Test Mode Select (TMS), Test Clock (TCK) and Test Data Output(TDO), are dedicated and therefore available for use at any stage of thedevice's lifetime, i.e. manufacturing through end use in a system. Sincethe JTAG Test Access Port became an IEEE standard in 1990, other IEEEstandards (IEEE 1149.4, IEEE 1149.6 and IEEE 1532) have been developedbased on the JTAG Test Access Port and signal interface. These otherIEEE standards are compliant to the rules in the JTAG Test Access Portstandard to insure interoperability between a device incorporating theJTAG Test Access Port standard and a device incorporating the otherstandards.

During development of the JTAG standard it was anticipated that thededicated Test Access Port interface signals mentioned above may need tobe used for testing purposes that are not compliant to the JTAGstandard. To prepare for this possibility, the JTAG standard set forthrules and permissions in the standard to allow a compliance enablepattern to be input to a device, via additional signal inputs, to enablethe JTAG interface signals to be used for other testing purposes.

The present disclosure provides a method and apparatus for allowing adevice's JTAG interface signals to be selectively used for; (1)accessing the device's JTAG Test Access Port, (2) accessing JTAGcompliant Access Ports, (3) accessing JTAG compatible Access Ports, and(4) accessing non-JTAG Access Ports. Advantageously, the access portselection method and apparatus of the disclosure is achieved using onlythe JTAG standard interface signals TDI, TMS, TCK and TDO.

FIG. 1 illustrates a first example of a standard JTAG Test Access Port(TAP) 102 in a device 104. The JTAG TAP includes a TDI input, a TMSinput, a TCK input, an optional TRST input, a TDO output, and an outputenable (OE) output. TDI inputs data to the TAP, TMS inputs control tothe TAP, TCK inputs clocks to the TAP, and TDO outputs data from theTAP. The OE output is used to enable a device output buffer to outputthe TDO output from the TAP whenever the TAP is in the Shift-DR orShift-DR states of the TAP state diagram of FIG. 4.

FIG. 2 illustrates a second example of a standard JTAG Test Access Port(TAP) 102 in a device 202. The JTAG TAP of FIG. 2 is exactly the same asthe JTAG TAP of FIG. 1. The only difference is that the TRST input tothe JTAG TAP is provided by a power on reset (POR) circuit within thedevice 202 instead of by the optional TRST input.

FIG. 3 illustrates the architecture of the standard JTAG TAP 102. Thearchitecture includes a JTAG TAP controller 302, an instruction register304, a bypass register 306, one or more data registers 308, multiplexers310 and 312, and a TDO output registration flip flop (FF) 314. The TAPcontroller 302 controls the capturing, shifting and updating of data tothe instruction register, bypass register, and data registers from TDIto TDO. The instruction register 304 stores an instruction that selectsdata to be shifted through the single bit bypass register or through aselected data register. The data registers 308 provide data input anddata output to test and/or other circuits in the device. Themultiplexers 310 and 312 pass the output of the selected register(instruction, bypass, or data) to the TDO output via FF 314. Thearchitecture and operation of the standard JTAG TAP 102 is well known inthe industry.

FIG. 4 illustrates the state diagram that defines the operation of theJTAG TAP controller 302 of FIG. 3. State diagram transitions occur onthe rising edge of TCK in response the logic level on TMS, as shown inFIG. 5. Also as seen in FIG. 5 and during the Shift-DR and Shift-IRstates, data is made available on TDI for input to the JTAG TAP from anexternal source and data is made available on TDO for output from theJTAG TAP to an external source on the rising edge of TCK. The timing andoperation of the TAP state diagram is well known in the industry.

BRIEF SUMMARY OF THE DISCLOSURE

This disclosure describes a method and apparatus for allowing any numberof access ports in a device to be selected individually or in groups andcontrolled by the JTAG TAP interface signals to perform a desiredoperation. The selection of an individual access port or a group ofaccess ports is achieved using an Access Port Selector circuit that isaccessed by the JTAG TAP interface signals.

BRIEF DESCRIPTION OF THE VIEWS OF THE DRAWINGS

FIG. 1 illustrates a first prior art JTAG test access port in a device.

FIG. 2 illustrates a second prior art JTAG test access port in a device.

FIG. 3 illustrates the JTAG test access port in more detail.

FIG. 4 illustrates the JTAG test access port controller state diagram.

FIG. 5 illustrates interface signal timing for a JTAG test access portin a device.

FIG. 6 illustrates an access port selection architecture in a deviceaccording to the disclosure.

FIG. 7 illustrates the operational state diagram and timing for theaccess port selection architecture according to the disclosure.

FIG. 8 illustrates an alternate access port selection architecture in adevice according to the disclosure.

FIG. 9 illustrates the access port selector in more detail according tothe disclosure.

FIG. 10 illustrates the port select register in more detail according tothe disclosure.

FIG. 11 illustrates an alternate access port selector according to thedisclosure.

FIG. 12 illustrates an operational state diagram for the alternateaccess port selector according to the disclosure.

FIG. 13 illustrates circuitry for enabling and disabling a JTAG testaccess port according to the disclosure.

FIG. 14 illustrates circuitry for enabling and disabling an additionalaccess port according to the disclosure.

FIG. 15 illustrates an access port selection architecture in a devicecontaining multiple types of access ports according to the disclosure.

FIG. 16 illustrates an alternate access port selection architecture in adevice containing multiple types of access ports according to thedisclosure.

FIG. 17 illustrates a JTAG compatible access port according to thedisclosure.

FIG. 18 illustrates an operational state diagram for a JTAG compatibleaccess port according to the disclosure.

FIG. 19 illustrates an alternate JTAG compatible access port accordingto the disclosure.

FIG. 20 illustrates another alternate JTAG compatible access portaccording to the disclosure.

FIG. 21 illustrates a non-JTAG access port according to the disclosure.

FIG. 22 illustrates an operational state diagram for a non-JTAG accessport according to the disclosure.

FIG. 23A illustrates an operational state diagram for accessing data andinstruction registers according to the disclosure.

FIG. 23B illustrates an operational state diagram for accessing data andinstruction registers according to the disclosure.

FIG. 23C illustrates an operational state diagram for accessing data andinstruction registers according to the disclosure.

FIG. 24 illustrates an alternate non-JTAG access port according to thedisclosure.

FIG. 25 illustrates an alternate non-JTAG access port according to thedisclosure.

FIG. 26 illustrates an operational state diagram for a non-JTAG accessport according to the disclosure.

FIG. 27 illustrates an operational state diagram for a non-JTAG accessport according to the disclosure.

FIG. 28 illustrates an alternate non-JTAG access port according to thedisclosure.

FIG. 29 illustrates an alternate non-JTAG access port according to thedisclosure.

FIG. 30 illustrates an access port selection architecture in a devicecapable of serially linking multiple access ports according to thedisclosure.

FIG. 31 illustrates a port select register augmented with access portlinking control signals according to the disclosure.

FIG. 32 illustrates another access port selection architecture in adevice capable of serially linking multiple access ports according tothe disclosure.

FIG. 33 illustrates a data register of an access port according to thedisclosure.

FIG. 34 illustrates a data register of an access port according to thedisclosure.

FIG. 35 illustrates a data register of an access port according to thedisclosure.

FIG. 36 illustrates a data register of an access port according to thedisclosure.

FIG. 37 illustrates a data register of an access port according to thedisclosure.

FIG. 38 illustrates a data register of an access port according to thedisclosure.

FIG. 39 illustrates a data register of an access port according to thedisclosure.

FIG. 40 illustrates a circuit for accessing an instrument connected tothe data register of FIG. 39 according to the disclosure.

FIG. 41 illustrates a connection between a controller and a singledevice containing an access port selection architecture according to thedisclosure.

FIG. 42 illustrates a connection between a controller and a multipledaisy-chained devices, each device containing an access port selectionarchitecture according to the disclosure.

FIG. 43 illustrates an addressable access port selection architecture ina device according to the disclosure.

FIG. 43A illustrates an alternate addressable access port selectionarchitecture in a device according to the disclosure.

FIG. 44 illustrates an addressable access port selector according to thedisclosure.

FIG. 45 illustrates a device address register according to thedisclosure.

FIG. 46 illustrates a port select register according to the disclosure.

FIG. 47 illustrates a parallel connection between a controller andmultiple devices, each device containing an addressable access portselection architecture according to the disclosure.

FIG. 48 illustrates a daisy-chain connection between a controller andmultiple devices, each device containing an addressable access portselection architecture according to the disclosure.

FIG. 49 illustrates an access port selection architecture in a devicecontaining a multiple mode access port and an access port selectoraccording to the disclosure.

FIG. 50 illustrates the access port selection architecture of FIG. 49where the access port selector selects the multiple mode access port tobe a JTAG test access port according to the disclosure.

FIG. 51 illustrates the access port selection architecture of FIG. 49where the access port selector selects the multiple mode access port tobe a JTAG compliant access port according to the disclosure.

FIG. 52 illustrates the access port selection architecture of FIG. 49where the access port selector selects the multiple mode access port tobe a JTAG compatible access port according to the disclosure.

FIG. 53 illustrates the access port selection architecture of FIG. 49where the access port selector selects the multiple access mode accessport to be non-JTAG access port according to the disclosure.

FIG. 54 illustrates an alternate access port selection architecture in adevice containing a multiple mode access port and an access portselector according to the disclosure.

FIG. 55 illustrates an access port selection architecture in a devicecontaining a multiple mode access port and an addressable access portselector according to the disclosure.

DETAILED DESCRIPTION OF THE DISCLOSURE

FIG. 6 illustrates a device 602 containing a first exampleimplementation of the access port selection architecture of the presentdisclosure. The architecture includes the device's JTAG TAP 102, atleast one additional access port 604, an access port selector 606,multiplexers 608 and 610, output enable (OE) gating circuit 612, TDOoutput buffer 614, and TCK inverter 616. According to the disclosure,the JTAG TAP 102 and the additional access port 604, when enabled,respond to the TMS signal on the rising edge of TCK and the access portselector 606 responds to the TMS signal on the falling edge of TCK. TheJTAG TAP 102 includes inputs for TDI, TMS, TCK, reset (RST) and enable(ENA) signals and outputs for OE and TDO signals. The JTAG TAP 102 isaugmented with additional circuitry that is responsive to the ENA signalto allow the JTAG TAP 102 to be disabled by the ENA signal and enabledby the ENA signal. An example of this additional enable/disablecircuitry is described later in regard to FIG. 13. The additional accessport 604 includes inputs for TDI, TMS, TCK, RST and ENA signals andoutputs for OE and data output (DO) signals. The access port selector606 includes inputs for TDI, TMS, inverted TCK (TCK*), and TRST signalsand outputs for first and second ENA signals, a RST signal, an OEsignal, a Select (SEL) signal, a DO signal, and a port select (PSEL)signal. Multiplexer 608 inputs the TDO output from the JTAG TAP 102, theDO output from the additional access port 604, the PSEL signal from theaccess port selector 606, and outputs a data output. Multiplexer 610inputs the data output from multiplexer 608, the DO from the access portselector 606, the SEL output from the access port selector and outputs adata output to TDO output buffer 614. Gating circuit 612, which could bean OR gate, inputs the OE signals from the JTAG TAP, the additionalaccess port, and access port selector and outputs an OE signal to TDOoutput buffer 614 to enable the buffer to output data during shiftoperations of the JTAG TAP, additional access port, or access portselector.

FIG. 7 is provided to illustrate the operational states and timing ofthe architecture of FIG. 6. The operational states of the architectureconsist of; (1) a state 700 where both the access port selector (APS)and access ports (AP) are in a reset state in response to the TRST inputor logic values input on TMS, (2) a state 702 where both the access portselector and the access ports are in an idle state in response to logicvalues input on TMS, (3) a state 704 where communication occurs to theaccess port selector while the access ports are idle in response tologic values input on TMS, and (4) a state 706 where communicationoccurs to the enabled access port while the access port selector andother access ports are idle in response to logic values input on TMS.Timing diagram 708 illustrates that logic values input on TMS, indicatedby darkened time slots, during the rising and falling edges of TCK instate 702 maintain the access port selector and the access ports in idlestate 702. In the idle state, the access port selector and access portsare idle and no data input or data output occurs on TDI and TDOrespectively, also indicated by darkened fill. Timing diagram 710illustrates that values input on TMS (not darkened) during the fallingedge of TCK enables the access port selector to input data from TDI andoutput data on TDO, while idle values on TMS (darkened) are input duringthe rising edge of TCK to maintain the access ports in an idle state.Timing diagram 712 illustrates that values input on TMS (not darkened)during the rising edge of TCK enables the enabled access port to inputdata from TDI and output data on TDO, while idle values on TMS(darkened) are input during the falling edges of TCK to maintain theaccess port selector in an idle state.

During communication with access port selector 606, its SEL output isset to control multiplexer 610 to pass the DO output from the accessport selector to the input of TDO buffer 614. Also the OE from theaccess port selector will be set to cause the gating circuit 612 toenable the output of TDO output buffer 614. In this condition the accessport selector is enabled to input data from TDI and output data to TDO.The data input to the access port selector is used to select one of theaccess ports (i.e. JTAG TAP or additional access port) for access bysetting the access port's ENA input to the enable state and outputtingcontrol on PSEL to cause multiplexer 608 to select the data output(TDO/DO) from the enabled access port to be output to TDO viamultiplexer 610 and TDO buffer 614. An enabled access port remainsenabled until the ENA and PSEL signals from the access port selector arechanged by a further communication with the access port selector.

When the enabled access port (JTAG TAP or additional access port) isenabled for communication, as mentioned above, it will respond to TMSand TCK to input data from TDI and output data on TDO. Duringcommunication the OE signal from the enabled access port will passthrough gating circuit 612 to enable the output of TDO output buffer614.

FIG. 8 is provided to illustrate a second example implementation of theaccess port selection architecture 802 according to the disclosure. Thearchitecture includes the device's JTAG TAP 102, at least one additionalaccess port 604, an access port selector 804, tri-state buffers 806-810,output enable (OE) gating circuit 612, TDO output buffer 614, and TCKinverter 616. The JTAG TAP 102 and the additional access port 604, whenenabled, respond to the TMS signal on the rising edge of TCK and theaccess port selector 804 responds to the TMS signal on the falling edgeof TCK. The JTAG TAP 102 includes inputs for TDI, TMS, TCK, RST and ENAsignals and outputs for OE and TDO signals. The JTAG TAP 102 isaugmented with additional circuitry that is responsive to the ENA signalto allow the JTAG TAP 102 to be disabled by the ENA signal and enabledby the ENA signal, as mentioned previously in regard to FIG. 6. Theadditional access port 604 includes inputs for TDI, TMS, TCK, RST andENA signals and outputs for OE and DO signals. The access port selector806 includes inputs for TDI, TMS, inverted TCK (TCK*), and TRST signalsand outputs for first and second ENA signals, a RST signal, an OEsignal, and a DO signal. During falling TCK edge communication with theaccess port selector 804, the OE signal from the access port selector804 is set to enable the DO output from the access port selector to beoutput on TDO via tri-state buffer 810 and TDO output buffer 614. Duringrising TCK edge communication with the JTAG TAP 102, the OE signal fromthe JTAG TAP is set to enable the TDO output from the JTAG TAP to beoutput on TDO via tri-state buffer 806 and TDO output buffer 614. Duringrising TCK edge communication with the additional access port 604, theOE signal from the additional access port is set to enable the DO outputfrom the additional access port to be output on TDO via tri-state buffer808 and TDO output buffer 614. As described in regard to FIG. 6, the OEsignals from the access port selector, JTAG TAP, and additional accessport are input to the enable input of the TDO output buffer 614 viagating circuit 612 (which could be an OR gate). As can be seen, thearchitecture of FIG. 8 utilizes the OE signals from the access portselector, the JTAG TAP, and the additional access port to couple thedata output (TDO/DO) from the port being accessed to the TDO output leadvia the tri-state buffers 806-810 and TDO output buffer 614. Thus thePSEL and SEL signals of the architecture of FIG. 6 to controlmultiplexing of the port data output signals to TDO is not required inthe architecture of FIG. 8.

As can be seen from FIGS. 6-8, the process of communicating with aplurality of access ports in a device, according to the disclosure,includes the steps of: (1) communicating with the access port selector606/804 using the JTAG interface signals to enable a first access portfor communication, (2) ceasing communication with the access portselector, (3) communicating with the first access port using the JTAGinterface signals, (4) ceasing communication with the first access port,(5) communicating with the access port selector using the JTAG interfacesignals to enable a second access port for communication, (6)communicating with the second access port using the JTAG interfacesignals, and (7) repeating the above steps to access the first andsecond or any additional desired access ports.

FIG. 9 illustrates an example implementation of the access port selector606 of the access port selection architecture of FIG. 6. The access portselector includes an access port selector controller 902, instructionregister 304, single bit bypass register 306, port select register 904,multiplexers 310 and 312, and optionally a TDO registration flip flop(FF) 906. As can be seen, the architecture of the access port selectoris identical to the architecture of the JTAG TAP described in regard toFIG. 3 with the exception of the optional TDO registration FF 906 andthe fact that it responds to the TMS signal on the falling edge of TCK(TCK*). If the optional FF 906 is used it will register DO data on therising edge of the TCK signal as shown in timing diagram 710 of FIG. 7.In this example, the access port selector controller 902 operates inresponse to TMS on the falling edge of TCK (TCK*) according to the TAPstate diagram of FIG. 4. In response to TMS and on the falling edge ofTCK the access port selector controller 902; (1) captures, shifts andupdates instructions into instruction register 304, (2) captures, shiftsand updates data into the port select register 904, (3) captures andshifts the bypass register 306, (4) is idle, or (5) is reset.

During instruction capture/shift/update operations the controller 902outputs control (CTL) to cause the instruction register 304 to capturedata during the Capture-IR state of FIG. 4, shift data during theShift-IR state of FIG. 4, and update data from its outputs during theUpdate-IR state of FIG. 4. Likewise, during data shift operations thecontroller 902 outputs control (CTL) to cause the selected data registerto capture data during the Capture-DR state of FIG. 4, shift data duringthe Shift-DR state of FIG. 4, and update data from its outputs (exceptfor the bypass register which has no update output) during the Update-DRstate of FIG. 4. During instruction and data shift operations, thecontroller 902 will set the SEL output to a state that will controlmultiplexer 610 of FIG. 6 to couple the DO output from the access portselector 606 to the TDO output via TDO output buffer 614. Also duringinstruction and data shift operations the controller 902 will set the OEoutput to a state that enables the output of the TDO output buffer 614.During idle operation in the Run Test/Idle state of FIG. 4 no controlactivity occurs from the controller 902. During reset operation thecontroller 902 is reset in the Test Logic Reset state of FIG. 4 andoutputs a reset signal (RST) signal to the instruction register 304,port select register 904, and to the access ports (JTAG TAP 102 andadditional access port 604) coupled to the access port selector 606. Thecontroller 902 can enter reset either by a reset signal applied to theTRST input or by TMS being high for a number of falling edge TCKs, ascan be seen in the TAP state diagram of FIG. 4.

The instruction shifted into and updated from the instruction register304 selects one of the bypass register 306 and port select register 904for access and couples the data output of the selected register to aninput of multiplexer 312 via multiplexer 310 so that it is output on DOto TDO during a data register scan operation.

When the port select register 904 is selected for access between TDI andDO/TDO it receives control (CTL) from the controller 902 to capture dataduring the Capture-DR state, shift data during the Shift-DR state, andupdate data to its outputs (ENA signals and PBSEL signals) during theUpdate-DR state. When the bypass register 306 is selected for accessbetween TDI and DO/TDO it receives control (CTL from the controller 902to capture data during the Capture-DR state and shift data during theShift-DR state. The bypass register 306 serves to reduce the shiftlength through the access port selector 606/804 to only one bit, whichis advantageous when multiple device access port selectors are connectedin a serial daisy-chain arrangement.

FIG. 10 illustrates an example implementation of the port selectregister 904 which comprises a shift register 1002 and an updateregister 1004. Control (CTL) input bus from the controller 608 causesthe shift register 1002 to capture data from the update register 1004outputs during the Capture-DR state, shift data from TDI to TDO duringthe Shift-DR state, and update data from the shift register to theupdate register outputs (i.e. ENA and PBSEL signals) during theUpdate-DR state. The update register output signals (ENA and PBSEL)captured into the shift register and shifted out during the shiftoperation can be used to verify or test that the port select register904 was outputting the correct ENA and PBSEL signals that were updatedduring a previous capture, shift and update operation. The control (CTL)input bus also carries the RST signal from the controller 608 which whenasserted resets the update register 1004 and optionally the shiftregister 1002. When the update register 1004 is reset it selects theJTAG TAP 102 as the enabled access port by setting the JTAG TAP's ENAsignal to the enable state and setting the PBSEL signals to select theJTAG TAP's TDO output to be selected for output on TDO. Selecting theJTAG TAP as the default access port following reset allows the JTAG TAPto be immediately accessed without having to first communicate with theaccess port selector 606 to select the JTAG TAP.

While FIG. 9 illustrates an example implementation of the access portselector 606 in the architecture of FIG. 6, it can also represent anexample implementation of the access port selector 804 in thearchitecture of FIG. 8 by simply deleting the PBSEL signal output fromthe port select register 904 and the SEL signal output from the accessport selector controller 902 (as shown in dotted line).

FIG. 11 illustrates an alternate example implementation of an accessport selector 1102 that can be used in the access port selectionarchitecture of FIGS. 8 and 9. The access port selector 1102 includes anaccess port selector controller 1104, the port select register 904, andoptionally DO registration flip flop (FF) 906. As can be seen, thearchitecture of the access port selector 1102 does not include theinstruction register 304, bypass register 306, and multiplexers 310 and312 of the access port selector 606 of FIG. 9. The access port selector1102 responds to TMS on the falling edge of TCK to operate according tothe state diagram of FIG. 12 to access the port select register (PSR)904. If the optional FF 906 is used it will register DO data on therising edge of the TCK signal as describe in FIG. 9.

As seen in the state diagram of FIG. 12, the access port selectorcontroller 1104 can be in a Reset state, an Idle state, a Select-PSRstate, a Capture-PSR state, a Shift-PSR state, and in an Update-PSRstate. In the Reset state, the controller 1104 outputs a reset signal onthe RST output which resets the port select register 904, as describe inregard to FIG. 10, and also resets the access ports in the architectureof FIG. 6. In the Idle state, the controller 1104 removes the resetsignal from the RST output but does not output any control (CTL) to theport select register 904. In the Select-PSR state, the controller cantransition to the Capture-PSR state or the Reset state. In theCapture-PSR state, the controller 1104 outputs control (CTL) to causethe shift register 1002 of the port select register to capture theoutput (ENA and PBSEL signals) of the update register 1004 as describedin FIG. 10. From the Capture-PSR state, the controller 1104 cantransition to the Shift-PSR state or to the Update-PSR state. In theShift-PSR state, the controller 1104 sets the SEL signal to a state thatenables the DO output from the port select register to be selected foroutput on TDO as shown in FIG. 6, sets the OE output to a state thatenables the TDO output buffer 614 of FIG. 6, and outputs control (CTL)to cause the shift register 1002 of the port select register to shiftdata from TDI to DO/TDO. The SEL and OE signals are only set asdescribed above while the controller 1104 is in the Shift-PSR state. Inthe Update-PSR state, the controller 1104 outputs control (CTL) toupdate the data in shift register 1002 to the update register 1004.

The state transitions in FIG. 12 occur in response to TMS logic valuesand in response to the falling edge of TCK. As seen the state diagramwill transition to the Reset state from any other state if a number oflogic 1's are input on TMS. The Reset state can also be entered inresponse to a reset signal on the TRST input.

While FIG. 11 illustrates an alternate example implementation of anaccess port selector 1102 that can be used in the access port selectionarchitecture of FIG. 6, it can also represent an example implementationof an alternate the access port selector that can be used in thearchitecture FIG. 8 by simply deleting the PBSEL signal output from theport select register 904 and the SEL signal output from the access portselector controller 1104 (as shown in dotted line).

FIG. 13 illustrates an example of how to use the ENA signal from accessport selector 606 of FIG. 6 or from access port selector 804 of FIG. 8to enable and disable the operation of a JTAG TAP 102 within a device1302. As seen the ENA signal is input to a gate 1304, an AND (A) gate inthis example, that is placed in series with the TCK signal to the JTAGTAP or is placed in series with the TMS signal to the JTAG TAP. Asindicated by dotted line, an AND gate 1304 can be used on either the TMSor the TCK signal. Alternately AND gates 1304 may be used on both theTMS and TCK signals. When the ENA signal is set low, the JTAG TAP isdisabled since the TMS and/or TCK outputs from the AND gate(s) areforced low. When the ENA signal is set high, the JTAG TAP is enabledsince the TMS and/or TCK outputs from the AND gate(s) are enabled topass the TMS and/or TCK signals to the JTAG TAP. The JTAG TAP can bedisabled in and enabled from any of the non-shifting stable states ofFIG. 4, i.e. the Test Logic Reset stable state, the Run Test/Idle stablestate, the Pause-DR stable state, and the Pause-IR stable state.

FIG. 14 illustrates an example of how to use the ENA signal from accessport selector 606 of FIG. 6 or from access port selector 804 of FIG. 8to enable and disable the operation of an additional access port 604within a device 1402. As seen the ENA signal is input to a gate 1304, anAND (A) gate in this example, that is placed in series with the TCKsignal to the additional access port 604 or is placed in series with theTMS signal to the additional access port. As indicated by dotted line,an AND gate 1304 can be used on either the TMS or the TCK signal.Alternately AND gates 1304 may be used on both the TMS and TCK signals.When the ENA signal is set low, the additional access port is disabledsince the TMS and/or TCK outputs from the AND gate(s) are forced low.When the ENA signal is set high, the additional access port is enabledsince the TMS and/or TCK outputs from the AND gate(s) are enabled topass the TMS and/or TCK signals to the additional access port. Theadditional access port can be disabled in and enabled from any of itsnon-shifting stable states. For example if the additional access portoperates according to the state diagram of FIG. 4 it can be disabled inor enabled from the Test Logic Reset stable state, the Run Test/Idlestable state, the Pause-DR stable state, and the Pause-IR stable state.

FIG. 15 illustrates a device 1502 containing the access port selectionarchitecture previously described in regard to FIG. 6. The architectureincludes a JTAG TAP 102, a multiplicity of different types of additionalaccess ports 604 (referenced as access ports 1504, 1506 and 1508),access port selector 606, and TDO multiplexers 608 and 610. The JTAG TAPand the additional access ports all include the TMS and/or TCKenable/disable circuitry described in regard to FIGS. 13 and 14. Theadditional access ports may include one or more JTAG compliant accessports 1504, one of more JTAG compatible access ports 1506, and one ormore non-JTAG access ports 1508. The additional access ports may be usedfor any type of access operation including but not limited to; testaccess operations, debug access operations, trace access operations,emulation access operations, programming access operations, embeddedinstrumentation access operations, or functional circuit accessoperations.

JTAG compliant access ports 1504, according to this disclosure, areaccess ports that are fully compliant with the architecture and requiredinstructions of the JTAG TAP 102, but may contain additionalinstructions and/or circuits to provide extended functionality. JTAGcompatible access ports 1506, according to this disclosure, are accessports that are not fully compliant with the architecture and operationof the JTAG TAP 102 but will operate compatibly in at least the Testlogic Reset state, the Shift-DR, the Shift-IR state, and the Update-IRstate of the TAP state diagram of FIG. 4. Being able to operatecompatibly in the Test Logic Reset state, the Shift-DR state, theShift-IR state, and the Update-IR state enables JTAG compatible accessports to operate with the JTAG TAP and JTAG compliant access portsduring reset, data shift, instruction shift, and instruction updateoperations when the ports are connected together in serial daisy-chainarrangements. Non-JTAG access ports 1508, according to this disclosure,are access ports that have architectures and operation modes that notcompliant or compatible with the JTAG TAP 102 or the JTAGcompliant/compatible access ports 1504-1506.

When enabled by the access port selector 606, an access port 102, 1504,1506, and 1508 will respond to TMS on the rising edge of TCK totransition through states and shift data from the device's TDI input tothe TDO output.

The access ports 1504-1508 may represent; (1) new IEEE standard accessports that can be enabled by the access port selector 606 and operatedusing the existing dedicated JTAG TDI, TCK, TMS, and TDO interfacesignals, (2) new non-IEEE standard access ports (i.e. access ports thatare developed by a consortium of companies) that can be enabled by theaccess port selector 606 and operated using the existing dedicated JTAGTDI, TCK, TMS, and TDO interface signals, or (3) new proprietary accessports a company develops for private use that can be enabled by theaccess port selector 606 and operated using the existing dedicated JTAGTDI, TCK, TMS, and TDO interface signals. The access ports 1504-1508 maybe associated with embedded core circuits in a device such as DSP andCPU core circuits, or the access ports may be associated with theoverall circuitry of a device.

FIG. 16 illustrates a device 1602 containing the access port selectionarchitecture previously described in regard to FIG. 8. The architectureincludes a JTAG TAP 102, a multiplicity of different types of additionalaccess ports 604 (1504, 1506, and 1508), and access port selector 804.The JTAG TAP 102 and the additional access ports 1504-1508 are the sameas described in FIG. 15. The only difference between the architecture ofFIG. 16 and the architecture of FIG. 15 is the access port selector 804and the circuitry (tri-state buffers) used to couple the data outputfrom an enabled access port or the data output from the access portselector to the TDO output of the device.

FIG. 17 illustrates a first example implementation 1702 of a JTAGcompatible access port 1506. The access port 1702 includes a JTAGcompatible access port controller 1704, an instruction register 304,bypass register 306, one or more data registers 308, data output (DO)multiplexers 310 and 312, an optional falling TCK edge operated DOregistration FF 314, and the TMS and/or TCK enable gates 1304 of FIGS.13 and 14. When enabled by the ENA input from the access port selector606/804 and the RST input is not asserted, the controller 1704 respondsto TMS on the rising edge of TCK to transition through and operate inthe states of FIG. 18. As seen in FIG. 18, the only defined states ofthe JTAG compatible controller 1704 state diagram are the Test LogicReset state 1802, the Shift-DR state 1804, the Shift-IR state 1806, andthe Update-IR state 1808. As mentioned in regard to FIG. 15, the TestLogic Reset state 1802 is compatible with the Test Logic Reset state ofFIG. 4 to allow compatible resetting, the Shift-DR state 1804 iscompatible with the Shift-DR state of FIG. 4 to allow compatible datashifting, the Shift-IR state 1806 is compatible with the Shift-IR stateof FIG. 4 to allow compatible instruction shifting, and the Update-IRstate is compatible with the Update-IR state of FIG. 4 to allowcompatible instruction updating. The other states in the controller 1704state diagram of FIG. 18 are definable to allow customizing the stateoperation of a JTAG compatible access port for a desired purpose. Thestate operation purpose may be similar to the state operation purpose ofthe JTAG TAP state diagram of FIG. 4 or different from the stateoperation purpose of the JTAG TAP state diagram of FIG. 4.

FIG. 19 illustrates a second example implementation 1902 of a JTAGcompatible access port 1506. The access port 1902 includes a JTAGcompatible access port controller 1704, an instruction bypass register1904, a data register 308, data output (DO) multiplexer 1906, anoptional falling TCK edge operated DO registration FF 314, and the TMSand/or TCK enable gates 1304 of FIGS. 13 and 14. When enabled by the ENAinput from the access port selector 606/804 and the RST input is notasserted, the controller 1704 responds to TMS on the rising edge of TCKto transition through and operate in the states of FIG. 18 as describedin regard to FIG. 17. The instruction bypass register 1904 is a two bitregister that couples TDI to TDO during Shift-IR operations to maintaininstruction shifting compatibility with series connected JTAG TAPsand/or JTAG compliant access ports. At the beginning of a Shift-IRoperation, the two FFs of the instruction bypass register 1904 willoutput a leading “01” pattern to DO/TDO as required by JTAG IEEE 1149.1instruction registers. The type of JTAG compatible access port in FIG.19 may be used when the purpose of the access port is only to seriallyaccess the data register 308 to input data to a circuit destination in adevice and/or output data from a circuit source in a device. As seen indotted line, the bits shifted into the two FFs may optionally be used asmode inputs to the data register, to allow the data register to operatein different modes when it is accessed.

FIG. 20 illustrates a third example implementation 2002 of a JTAGcompatible access port 1506. The access port 2002 includes a JTAGcompatible access port controller 1704, an instruction register 304, adata bypass register 2004, data output (DO) multiplexer 1906, anoptional falling TCK edge operated DO registration FF 314, and the TMSand/or TCK enable gates 1304 of FIGS. 13 and 14. When enabled by the ENAinput from the access port selector 606/804 and the RST input is notasserted, the controller 1704 responds to TMS on the rising edge of TCKto transition through and operate in the states of FIG. 18 as describedin regard to FIG. 17. The data bypass register 2004 is a single FF thatcouples TDI to TDO during Shift-DR operations to maintain data shiftingcompatibility with series connected JTAG TAPs and/or JTAG compliantaccess ports. At the beginning of a Shift-DR operation, the FF of thedata bypass register 2004 will output a leading “0” to DO/TDO asrequired by JTAG IEEE 1149.1 bypass registers. The type of JTAGcompatible access port in FIG. 20 may be used when the purpose of theaccess port is only to serially access the instruction register 304 toinput instructions to a circuit destination within a device

FIG. 21 illustrates a first example implementation 2102 of a non-JTAGaccess port 1508. The access port 2102 includes a non-JTAG access portcontroller 2104, an instruction register 304, bypass register 306, oneor more data registers 308, data output (DO) multiplexers 310 and 312,an optional falling TCK edge operated DO registration FF 314, and theTMS and/or TCK enable gates 1304 of FIGS. 13 and 14. When enabled by theENA input from the access port selector 606/804 and the RST input is notasserted, the controller 2104 responds to TMS on the rising edge of TCKto transition through and operate in the states of the state diagram ofFIG. 22. The state diagram of FIG. 22 is similar to the state diagram ofFIG. 4 in regard to the Reset state 2202, Idle state 2204, Select-DRstate 2206, and Select-IR 2208 state. However the data register accessstate (Access-DR) 2210 and the instruction register access state(Access-IR) 2212 states may be designed completely different from thedata register and instruction access states of FIG. 4.

FIG. 23A illustrates a first example state transition diagram for theAccess-DR and Access-IR states 2210-2212 of FIG. 22 whereby a capturestate is provided for capturing data into the IR or a DR, a shift stateis provided for shifting data from TDI to DO/TDO through the IR or a DR,and an update state is provided for updating data from the IR or a DR.FIG. 23B illustrates a second example state transition diagram for theAccess-DR and Access-IR states 2210-2212 of FIG. 22 whereby a capturestate is provided for capturing data into the IR or a DR, a shift stateis provided for shifting data from TDI to DO/TDO through the IR or a DR,and an exit state is provided for repeating the capture and shiftoperations or exiting the capture and shift operations. FIG. 23Cillustrates a third example state transition diagram for the Access-DRand Access-IR states 2210-2212 of FIG. 22 whereby a shift state isprovided for shifting data from TDI to DO/TDO through the IR or a DR, anupdate state is provided for updating data from the IR or DR, and anexit state is provided for repeating the shift and update operations orexiting the shift and update operations.

FIG. 24 illustrates a second example implementation 2402 of a non-JTAGaccess port 1508. The access port 2402 includes a non-JTAG access portcontroller 2104, an instruction register 304, a data register 308, dataoutput (DO) multiplexer 2404, an optional falling TCK edge operated DOregistration FF 314, and the TMS and/or TCK enable gates 1304 of FIGS.13 and 14. When enabled by the ENA input from the access port selector606/804 and the RST input is not asserted, the controller 2104 respondsto TMS on the rising edge of TCK to transition through and operate inthe states of the state diagram of FIG. 22. During the Access-DR state2210 the data register 308 is accessed from TDI to DO/TDO and during theAccess-IR state 2212 the instruction register is accessed from TDI toDO/TDO. The instruction loaded into the instruction register 304 can beused to output mode control to place the data register 308 in differentoperational modes and/or to output control to other circuits in adevice.

FIG. 25 illustrates a third example implementation 2502 of a non-JTAGaccess port 1508. The access port 2502 includes a non-JTAG access portcontroller 2504, a data register 308, an optional falling TCK edgeoperated DO registration FF 314, and the TMS and/or TCK enable gates1304 of FIGS. 13 and 14. When enabled by the ENA input from the accessport selector 606/804 and the RST input is not asserted, the controller2504 responds to TMS on the rising edge of TCK to transition through andoperate in the states of state diagram of FIG. 26 or state diagram ofFIG. 27. The difference between the two state diagrams is that thediagram of FIG. 26 includes a reset state whereas the diagram of FIG. 27does not include the reset state. During the Access-DR states of FIGS.26 and 27 the data register 308 is accessed from TDI to DO/TDO. TheAccess-DR states of FIGS. 26 and 27 could be designed as shown in thestate diagram examples of FIG. 23A, 23B, or 23C.

FIG. 28 illustrates a fourth example implementation 2802 of a non-JTAGaccess port 1508. The access port 2802 includes a non-JTAG access portinterface 2804 consisting of two multiplexers 2808 and 2810, a dataregister 308, inverter 2806 and an optional falling TCK edge operated DOregistration FF 314. When the ENA signal input from the access portselector 606/804 is set low (i.e. the port disable state), multiplexer2808 sets the load/shift (L/S) signal output to data register 308 high(H) and multiplexer 2810 sets the clock (CLK) signal output to dataregister 308 low (L). When the ENA signal input is set high (i.e. portenable state), multiplexer 2808 allows the TMS signal to drive the L/Ssignal to the data register and multiplexer 2810 allows the TCK signalto drive the CLK signal to the data register. When the L/S signal isdriven high by TMS, the data register loads or captures data on therising edge of the CLK signal and when the L/S signal is driven low byTMS the data register shifts data from TDI to DO/TDO on the rising edgeof the CLK input. As seen in this example, the L/S signal is coupled tothe port OE signal via inverter 2806 to enable the TDO output buffer 614of FIGS. 15 and 16 to output data from DO to TDO when the L/S signal islow to shift the data register. When the port is disabled (ENA signal islow) the OE signal will be driven low by the high being output on theL/S signal from multiplexer 2808.

FIG. 29 illustrates a fifth example implementation 2902 of a non-JTAGaccess port 1508. The access port 2902 is similar to access port 2802 inthat it includes the non-JTAG access port interface 2804, a dataregister 308, inverter 2806 and an optional falling TCK edge operated DOregistration FF 314. The access port 2902 can operate the data register308 in either a functional mode or in a test mode in response to the ENAsignal. When the ENA signal input from the access port selector 606/804is set low (i.e. the port disable state), multiplexer 2808 sets the L/Ssignal output to data register 308 high and multiplexer 2810 selects afunctional clock (FCK) signal to drive the CLK signal output to dataregister 308. While the ENA input is low the data register 308 operatesas a device functional register in response to the rising edge of theFCK signal to input and output functional data to and from functionalcombinational logic 2904. When the ENA signal input is set high (i.e.port enable state), multiplexer 2808 selects the TMS signal to drive theL/S signal and multiplexer 2810 selects the TCK signal to drive the CLKsignal. While the ENA input is high the data register 308 operates as ascan test register in response the rising edge of TCK to shift test datain and out of the data register while TMS (L/S) is low and to capturetest data from the combinational logic 2904 when TMS (L/S) is high. Asmentioned in FIG. 28, the L/S signal enables the TDO output buffer 614via inverter 2806 during data register shift operations. Also asmentioned in FIG. 28, when the port is disabled (ENA signal is low) theOE signal will be driven low by the high being output on the L/S signalfrom multiplexer 2808.

FIG. 30 illustrates a device 3002 containing the port accessarchitecture of FIG. 15 modified to allow the JTAG TAP, JTAG compliantaccess ports, and JTAG compatible access ports to be serially linkedtogether. The architecture is identical to the FIG. 15 architecture withthe exception that multiplexers 3004 and 3006 have been placed on theTDI inputs of the JTAG compliant access port 1504 and JTAG compatibleaccess port 1506 and the access port selector 606 has been modified toinclude link control outputs 3008. The modification of the access portselector 606 can be achieved by simply adding additional serial registerbits to the port select register 904 to provide the link control outputs3008 as shown in FIG. 31. When the link control outputs are not set forlinking the access the ports 102, 1504, and 1506, the access ports maybe individually accessed as described in regard to FIG. 15. If the linkcontrol input to multiplexer 3004 is set for linking, ports 102 and 1504are serially linked together so that data and instructions can becommunicated through the ports from the TDI input of port 102 to the DOoutput of port 1504 and on to the TDO output of the device viamultiplexers 608 and 610. If the link control input to multiplexer 3006is set for linking, ports 1504 and 1506 are serially linked together sothat data and instructions can be communicated through the ports fromthe TDI input of port 1504 to the DO output of port 1506 and on to theTDO output of the device via multiplexers 608 and 610. When bothmultiplexers are set for linking, data and instructions can becommunicated through ports 102, 1504 and 1506 from the TDI input of port102 to the DO of port 1506. Port linking is beneficial when multipleports need to operate together to perform a complex test, debug,emulation, programming, instrumentation, or functional operation in adevice. JTAG compatible ports 1506 can be linked with JTAG TAP 102 andJTAG compliant ports 1504 since they operate compliantly in the Shift-IRand Shift-DR states of FIG. 18.

FIG. 32 is provided to simply illustrate that non-JTAG access ports 1508may also be serially linked together and accessed from TDI to TDO asdescribe in FIG. 30, as long as the ports 1508 use compatible shiftingprotocols.

The data registers 308 of the access ports 102, 1504, 1506 and 1508 inthis disclosure may be used for any type of operation including but notlimited to; a test operation, a debug operation, a trace operation, anemulation operation, a programming operation, an instrumentationoperation, a functional digital operation, a functional mixed signaloperation, and a functional analog operation. Some example dataregisters 308 of this disclosure are described below in FIGS. 33-40.

FIG. 33 illustrates an example data register 308 of this disclosure thatoperates in response to CTL input from an access port of this disclosureto; (1) input data from TDI and output the data to a destination and (2)input data from a source and output the data to TDO via DO.

FIG. 34 illustrates an example data register 308 of this disclosure thatoperates in response to CTL input from an access port of this disclosureto input data from TDI and output the data to a destination.

FIG. 35 illustrates an example data register 308 of this disclosure thatoperates in response to CTL input from an access port of this disclosureto input data from a source and output the data to TDO via DO.

FIG. 36 illustrates an example data register 308 of this disclosure thatoperates in response to CTL input from an access port of this disclosureto; (1) input data from TDI and output the data to a destination via anupdate register and (2) input data from a source and output the data toTDO via DO.

FIG. 37 illustrates an example data register 308 of this disclosure thatoperates in response to CTL input from an access port of this disclosureto input data from TDI and output the data to a destination via anupdate register.

The sources and destinations of FIGS. 33-47 may be; (1) test circuits orcircuits being tested, (2) debug circuits or circuits being debugged,(3) trace circuits or circuits being traced, (4) emulation circuits orcircuits being emulated, (5) programming circuits or circuits beingprogrammed, (6) instrumentation circuits or circuits be instrumented,and/or (7) functional circuits or circuits being functioned. Thefunctional circuits of this disclosure include, but are not limited too,digital circuits such as DSPs and CPUs, mixed signal circuits such asDACs, ADCs, CODECs and PLLs, and analog circuits such as amplifiers,translators and receivers.

FIG. 38 illustrates an example data register 308 of this disclosure thatoperates in response to CTL input from an access port of this disclosureas a scan test compression circuit for testing circuits-under-testwithin a device. Scan test compression circuits, such as Mentor's TestKompress™ circuit, are well known. Scan test compression circuits use adecompressor (D) to decompress a serial input from a tester (TDI) intoparallel outputs that are shifted into parallel scan registers andapplied as stimulus to the circuit-under-test. Scan test compressioncircuits also use a compactor (C) circuit to compact thecircuit-under-test response output from the parallel scan registers intoa serial output to the tester (DO/TDO).

FIG. 39 illustrates an example data register 308 of this disclosure thatoperates in response to CTL input from an access port of this disclosureas an instrument access register to access embedded instruments within adevice. The instrument access register includes a series of deviceselect modules (DSM) as described in U.S. Pat. No. 4,872,169 and shownin FIG. 40. Each DSM has a shift register (S), update register (U),multiplexer (M), and control gating (G). Serial data (SI) shifted intothe shift register (S) is either output on the serial output (SO) viathe multiplexer or routed through an instrument via DO and DI thenoutput on the serial output via the multiplexer (M). The routing path isselected by the data bit value updated into the update register (U). Toselect access to an instrument the data value shifted into the shiftregister (S) and updated into the update register (U) enables thecontrol gating (G) to pass control (CTL) to the instrument and controlsthe multiplexer (M) to output data from the instrument. In thisarrangement data can communicated to and from the instrument from SI toSO of the DSM. Any number of instruments can be accessed by simplyproviding a DSM for each instrument. An instrument access registersimilar to that of FIG. 39 is being proposed for standardization indeveloping IEEE standard P1687.

FIG. 41 illustrates an example interface between a controller 4102 and asingle device 4104 containing one of the port selection architectures(PSA) described in regard to FIGS. 6, 8, 15, 16, 30 and 32 of thisdisclosure. The controller 4102 communicates with the PSA as describedin regard to FIG. 7 to select an access port for access, then access theaccess port. When the device 4104 powers up or in response to a resetinput on TRST or a reset sequence on TMS, the PSA's JTAG TAP will beselected for immediate access as mentioned in regard to FIG. 10. Thecontroller 4102 may be a test controller, a debug controller, anemulation controller, a programming controller, an instrumentationcontroller, or a functional controller.

FIG. 42 illustrates an example interface between a controller 4102 and adaisy-chain of devices 4202-4206, each device containing one of the portaccess architectures (PSA) described in regard to FIGS. 6, 8, 15, 16, 30and 32 of this disclosure. The controller 4102 communicates with each ofthe daisy-chained PSA as described in regard to FIG. 7 to select anaccess port in each PSA for access, then accesses the daisy-chainedaccess ports. As mentioned in regard to FIG. 41 the JTAG TAP of eachdevice PSA will be immediately available for access by the controller4102 after the devices 4202-4206 power up or in response to a TRSTsignal or TMS reset sequence.

FIG. 43 illustrates a device 4302 containing an addressable access portselection architecture. The addressable access port selectionarchitecture is the same as the access port selection architecture ofFIG. 6 with the exception that the access port selector of FIG. 6 hasbeen replaced with an addressable access port selector 4304 and a gate4306 has been inserted between the output of OE gating 612 and theenable input of TDO buffer 614. As seen, the addressable access portselector 4304 contains all the signals of access port selector 606 plusa match signal, which is used to turn gate 4306 off and on. Theaddressable access port selection architecture of FIG. 43, as will bedescribed below, advantageously allows for devices containing theaddressable access port architecture to be accessed by a controller 4102when the devices are connected to the controller in a serial daisy-chainarrangement or in a parallel addressable arrangement.

FIG. 43A is provided to illustrate that the addressable access portselector 4304 could be used in the access port selection architecture802 of FIG. 8 simply by replacing the access port selector 804 with theaddressable access port selector 4304 and inserting gate 4306 between OEgating 612 and TDO buffer 614. As seen the PSEL and SEL signals of theaddressable access port selector 4304 are not needed in the architectureof FIG. 43A since tri-state buffers are used instead of multiplexers toroute data from a port to the TDO output.

FIG. 44 illustrates the addressable access port selector 4304 of FIGS.43 and 43A. As seen, selector 4304 is the same as the access portselector 902 of FIG. 9 with the exception that it contains a deviceaddress register 4402 and a modified port select register 4404. Thedevice address register 4402 operates as the other registers to inputdata from TDI and output data to TDO via multiplexer 310 and 312 inresponse to control input from controller 902. The device addressregister 4402 outputs a match signal when it receives an address inputon TDI that matches the device address in device address register 4402.The match signal is input to the port select register 4404 and is outputfrom the addressable access port selector 4304 to gate 4306 of FIGS. 43and 43A. The port select register 4404 is identical to the port selectregister 904 of FIG. 9 with the exception that it is enabled anddisabled by the match signal input from device address register 4402. Atpower up or after a reset, the match signal is set to a disable statethat disables update operations to the port select register 4404 andforces the output of gate 4306 to a state that tri-states the TDO buffer614 of FIGS. 43 and 43A. When an address is input to the device addressregister 4402 that matches the device address the match signal is set toan enable state that enables update operations to the port selectregister 4404 and removes the forced tri-state condition on the TDOoutput buffer 614. When the match signal is set to the enable state, theaddressable access port selector 4304 operates to select access ports inexactly the same way as the access port selector 606 of FIGS. 6 and 804of FIG. 8.

FIG. 45 illustrates an example implementation of the device addressregister 4402 of FIG. 44 which includes a device address circuit 4502, acompare circuit 4504, a shift register 4506, and a flip flop (FF) 4508connected as shown. When capture control is input on the control (CTL)bus from the controller 902, the shift register captures the deviceaddress output from the device address circuit. When shift control isinput on the CTL bus from controller 902, the shift register shifts datafrom TDI to DO/TDO to input a device address and to output the captureddevice address. When update control is input on the CTL bus fromcontroller 902, the FF loads the match output from the comparator. Ifthe device address shifted into the shift register matches the deviceaddress output from the device address circuit, the comparator outputsan enable state on the match output to FF 4508 that enables theoperation of the port select register 4404 and removes the forcedtri-state condition on the TDO output buffer 614 as mentioned in regardto FIG. 44. The match signal output from FF 4508 output will remain inthe enable state until another capture, shift and update controlsequence is input to the device address register 4402. In response tothe another capture, shift and update control sequence, FF 4508 willagain load the match output from the comparator and set the match outputof the FF to either the disable state (address mismatch) or enable state(address match). In response to a reset input on the CTL bus fromcontroller 902, the FF 4508 match output will be set to the disablestate mentioned in regard to FIG. 44. Also in response to the resetinput the shift register may optionally be reset to a state that doesnot match the device address.

It is important to note that when the shift register 4506 captures thedevice address output from the device address circuit 4502, it outputsthe captured device address to the comparator. Following the captureoperation, the device address output from the shift register is the sameas the device address output from the device address circuit, whichcauses the match output from the comparator 4504 to be set to the enablestate. If no shift operation occurs and the update operation follows thecapture operation, the match output of FF 4508 will be set to the enablestate during the update operation. Thus the match output of the deviceaddress register 4402 can be set to the enable state by simplyperforming a capture and update operation.

As will be described below, performing a capture and update operationenables devices with the addressable access port selection architectureof FIGS. 43 and 43A to operate in the serial daisy-chain arrangement ofFIG. 48 and performing a capture, shift and update operation enablesdevices with the addressable access port selection architecture of FIGS.43 and 43A to operate in the parallel addressable arrangement of FIG.47.

FIG. 46 illustrates an example implementation of the port selectregister 4404 of FIG. 44. The port select register 4404 is identical tothe port selector 904 of FIG. 10 with the exception that the updateregister 1004 of FIG. 10 has been replaced with the update register 4602of FIG. 46. Update register 4602 is the same as the update register 1004with the exception that it includes an input for receiving the matchsignal from the device address register 4402. If the match signal is inthe disable state mentioned in FIG. 44 the update register 4602 does notrespond to update control inputs on the CTL bus of access port selectorcontroller 902. If the match signal is in the enable state mentioned inFIG. 44 the update register 4602 responds to update control inputs onthe CTL bus of access port selector controller 902. Thus the updateregister 4602 can only update its outputs with new data from shiftregister 1002 when the match signal is set to the enable state. Theupdate register 4602 responds to a reset signal on the CTL bus asdescribed in regard to the update register 1004 of FIG. 10.

FIG. 47 illustrates an example interface between a controller 4102 andparallel devices 4702-4706, each device containing the addressable portselection architecture (APSA) described in regard to FIGS. 43 and 43A ofthis disclosure. The controller 4102 communicates with a selected one ofthe devices by inputting the device's address to all APSAs, using thecapture, shift and update sequence described in regard to the deviceaddress register 4402 of FIG. 45. The APSA of the device having anaddress that matches the address input sets its match signal (FIG. 45)to the enable state. The APSAs of the non-addressed devices will set orkeep their match signal in the disable state. Once a device APSA isselected by its match signal, the APSA can be operated by the controller4102 to select a device access port for access using the port selectregister 4404 of FIG. 46 as previously described in this disclosure.

This process of selecting a device for access by inputting the device'saddress to all devices is repeated each time a different device isaccessed. Since only one of the devices can be addressed (i.e. matchsignal set to the enable state) at a time, no contention occurs on thebussed device TDO outputs to the controller. Following a power up or areset operation, none of the APSAs of devices 4702-4706 will beaddressed (i.e. match signals of all APSAs are set to the disablestate). Thus when the controller 4102 shifts a device address into thedevice APSAs following power up or reset, no TDO data will be output tothe controller 4102 since all device TDO outputs will be tri-state bythe disable state of the match signals.

FIG. 48 illustrates an example interface between a controller 4102 andserially daisy-chained devices 4702-4706. The devices 4702-4706 are thesame devices shown in FIG. 47. The only difference is that the device4702-4706 of FIG. 48 are arranged serially instead of in parallel asshown in FIG. 47. To enable serial access to all the devices of FIG. 48,the controller performs the capture and update sequence described inregard to FIG. 45 to set the match signals of all the devices APSAs tothe enabled state. Once the initial capture and update sequence isperformed, the controller can access all the device APSAs in the serialdaisy-chain arrangement of FIG. 48 as described in the serialdaisy-chain arrangement of FIG. 42.

The advantage of designing devices with the APSA of FIGS. 43 and 43A isthat it enables the devices to be used in a device manufacturer's testenvironment or in a customer's system in either the parallel addressableaccess arrangement of FIG. 47 or the serial daisy-chain arrangement ofFIG. 48. The parallel addressable access arrangement of FIG. 47 isenabled by performing the capture, shift and update sequence describedin FIG. 45 to select an individual device for access and the serialdaisy-chain access arrangement of FIG. 48 is enabled by performing thecapture and update sequence described in FIG. 45 to select all thedevices for access.

FIG. 49 illustrates a device 4902 including another type of deviceaccess port architecture according to this disclosure. The accessarchitecture is similar to the access architecture of FIG. 6 in that itcomprises an access port selector 606, OE gating 612, TDO output buffer614, a multiplexer 610, and TCK inverter 616. The architecture of FIG.49 differs from the architecture of FIG. 6 in that it contains a singlemultiple mode access port 4904, instead of separate access ports 102 and604. As with the separate access ports 102 and 604, the multiple modeaccess port 4904 responds to TMS on the rising edge of TCK to perform anaccess port operation. The multiple mode access port 4904 inputs modecontrol signals from access port selector 606 to program the access port4904 for different types of access port operations, including but notlimited to the JTAG TAP 102 operation of this disclosure, the JTAGcompliant access port 1504 operation of this disclosure, the JTAGcompatible access port 1506 operation of this disclosure, and thenon-JTAG access port 1508 of this disclosure. The mode control signalscome from the update register 1004 of the port select register 904 ofFIGS. 9 and 10 and replaces the ENA and PBSEL signals. The mode controlsignals are established by accessing the access port controller 606 onthe falling edge of TCK as described in this disclosure to shift in andupdate a desired mode control signal pattern from the port selectregister 904 to the mode control inputs of the multiple mode access port4904. In response to the mode control input, the multiple mode accessport is programmed or otherwise configured to operate as one of theabove mentioned access ports 102 and 1504-1508. Each different accessport operation of the multiple mode access port 4904 will be enabled bya unique pattern on the mode control input from the access port selector606. At device power up or in response to a TRST signal or a TMS resetsequence, the multiple mode access port 4904 will receive mode controlinput from the access port selector 606 to cause the multiple modeaccess port to operate as the JTAG TAP 102 for the reasons mentioned inregard to FIG. 10.

FIG. 50 illustrates the device 4902 with the multiple mode access port4904 programmed or otherwise configured, via a first mode control inputpattern from access port selector 606, to operate as a JTAG TAP 102according to this disclosure.

FIG. 51 illustrates the device 4902 with the multiple mode access port4904 programmed or otherwise configured, via a second mode control inputpattern from access port selector 606, to operate as a JTAG compliantaccess port 1504 according to this disclosure.

FIG. 52 illustrates the device 4902 with the multiple mode access port4904 programmed or otherwise configured, via a third mode control inputpattern from access port selector 606, to operate as a JTAG compatibleaccess port 1506 according to this disclosure.

FIG. 53 illustrates the device 4902 with the multiple mode access port4904 programmed or otherwise configured, via a fourth mode control inputpattern from access port selector 606, to operate as a non-JTAG accessport 1508 according to this disclosure.

FIG. 54 is provided to illustrate that a device 5402 may contain amultiple mode access port 4904 that is controlled by the access portselector 804 of FIG. 8. The operation of the multiple mode access portin response to mode control input from access port selector 804 is thesame as described in FIGS. 49-53. The main difference is that tri-statebuffers, instead of multiplexer 610, are used to couple the DO from theaccess port selector 804 or the DO from the multiple mode access port tothe device TDO via buffer 614.

FIG. 55 is provided to illustrate that a device 5502 may contain amultiple mode access port 4904 that is controlled by the addressableaccess port selector 4304 of FIGS. 43 and 43A. The operation of themultiple mode access port in response to mode control input from accessport selector 4304 is the same as described in FIGS. 49-53. The maindifference is that multiple devices 5502 can be used in a paralleladdressable arrangement as described in regard to FIG. 47 or in a serialdaisy-chain arrangement as described in regard to FIG. 48.

It is important to note that while this disclosure has described therising edge operated device access ports and the falling edge operateddevice access port selector as being interfaced to a device's JTAG TDI,TMS, TCK, and TDO interface terminals, it is not limited to use withthese JTAG interface terminals. Indeed, the rising edge access ports andthe falling edge access port selector of the disclosure may beinterfaced to any device interface terminal signal group that includes asignal for inputting data, like TDI, a signal for inputting a clock,like TCK, a signal for inputting a mode control, like TMS, and a signalfor outputting data, like TDO.

It is also important to note that while this disclosure has describedthe falling edge operated access port selector as a circuit forselecting access to rising edge operated access ports related to theJTAG test access port, the access port selector is not limited toselecting access to access ports related to the JTAG test access port.Indeed, the falling edge operated access port selector of thisdisclosure may be used to select access to any type of rising edgeoperated access port in a device.

Further, while this disclosure has described operating device accessports on the rising edge of a clock and operating device access portselectors on the falling edge of the clock, it should be understood thatthe clock edges could be reversed such that device access ports operateon the falling edge and device access port selectors operate on therising edge as well.

Although the disclosure has been described in detail, it should beunderstood that various changes, substitutions and alterations may bemade without departing from the spirit and scope of the disclosure asdefined by the appended claims.

ASPECTS OF THE DISCLOSURE

Aspect 1 (FIG. 6)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a first access port having an input connected to the TDI input terminal,an input connected to the TMS input terminal, an input connected to theTCK input terminal, an enable input, and a data output,

a second access port having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an inputconnected to the TCK input terminal, an enable input, and a data output,

an access port selector having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an input coupledto the TCK input terminal via an inverter,

a first enable output connected to the enable input of the first accessport, a second enable output connected to the enable input of the secondaccess port, control outputs, and a data output, and;

multiplexer circuitry having a data input connected to the data outputof the first access port, a data input connected to the data output ofthe second access port, a data input connected to the data output of theaccess port selector, control inputs connected to the control outputs ofthe access port selector, and a data output coupled to the TDO outputterminal.

Aspect 2 (FIG. 15)

The electrical device of ASPECT 1 wherein the first access port is aJTAG (IEEE 1149.1 standard) test access port and the second access portis one of a JTAG compliant access port, a JTAG compatible access port,and a non-JTAG access port.

Aspect 3 (FIG. 8)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a first access port having an input connected to the TDI input terminal,an input connected to the TMS input terminal, an input connected to theTCK input terminal, an enable input, an output enable output, and a dataoutput,

a second access port having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an inputconnected to the TCK input terminal, an enable input, an output enableoutput, and a data output,

an access port selector having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an input coupledto the TCK input terminal via an inverter,

a first enable output connected to the enable input of the first accessport, a second enable output connected to the enable input of the secondaccess port, an output enable output, and a data output, and;

a first tri-state buffer having a data input connected to the dataoutput of the first access port, an enable input connected to the outputenable output of the first access port, and a data output,

a second tri-state buffer having a data input connected to the dataoutput of the second access port, an enable input connected to theoutput enable output of the second access port, and a data output,

a third tri-state buffer having a data input connected to the dataoutput of the access port selector, an enable input connected to theoutput enable output of the access port selector, and a data output,and;

a fourth tri-state buffer having a data input connected to the dataoutputs of the first, second and third tri-state buffers and a dataoutput connected to the TDO output terminal.

Aspect 4 (FIG. 16)

The electrical device of ASPECT 3 wherein the first access port is aJTAG (IEEE 1149.1 standard) test access port and the second access portis one of a JTAG compliant access port, a JTAG compatible access port,and a non-JTAG access port.

Aspect 5 (FIG. 7)

A process of operating an access port in a device and an access portselector in the device from a common clock comprising the steps of:

operating the access port in response to a first edge of the commonclock, and;

operating the access port selector in response to a second edge of thecommon clock.

Aspect 6 (FIG. 9)

An access port selector in a device for enabling access to a selectedone of plural access ports in the device comprising:

an access port selector controller operable in response to an input froma TMS terminal of the device on the falling edge of a clock input from aTCK terminal of the device to output instruction and data registercontrol signals,

an instruction register responsive to the instruction register controlsignals to serially input an instruction from a TDI terminal of thedevice and to update the serially input instruction on parallel outputsof the instruction register, and;

an access port select register selectively responsive to the dataregister control signals to serially input port selection data from theTDI terminal of the device and to update the serially input portselection data on parallel outputs of the access port select register.

Aspect 7 (FIG. 9)

The access port selector of ASPECT 6 further comprising a bypassregister selectively responsive to the data register control signals toserially input bypass data from the TDI terminal and to pass the bypassdata to a TDO terminal of the device.

Aspect 8 (FIG. 11)

An access port selector in a device for enabling access to a selectedone of plural access ports in the device comprising:

an access port selector controller operable in response to an input froma TMS terminal of the device on the falling edge of a clock input from aTCK terminal on the device to shift access port selection data into anaccess port select register from a TDI terminal of the device and toupdate the access port selection data to parallel outputs of the accessport select register.

Aspect 9 (FIGS. 17 and 18)

A JTAG compatible access port in a device comprising:

a JTAG compatible access port controller compatibly operable in responseto TMS and TCK signals in at least the Test Logic Reset, Shift-DR,Shift-IR and Update-IR states of the standard JTAG/1149.1 test accessport state diagram,

an instruction register operable to shift data when the JTAG compatibleaccess port controller is operating in the Shift-IR state, to updatedata when the JTAG compatible access port controller is operating in theUpdate-IR state, and to reset the JTAG compatible access port when theJTAG compatible access port is operating in the Test Logic Reset state,and;

a data register operable to shift data when the JTAG compatible accessport controller is operating in the Shift-DR state.

Aspect 10 (FIGS. 19 and 18)

A JTAG compatible access port in a device comprising:

a JTAG compatible access port controller compatibly operable in responseto TMS and TCK signals in at least the Test Logic Reset, Shift-DR,Shift-IR and Update-IR states of the standard JTAG/1149.1 test accessport state diagram,

a data register operable to shift data when the JTAG compatible accessport controller is operating in the Shift-DR state, and;

an instruction bypass register operable to shift data when the JTAGcompatible access port controller is operating in the Shift-IR state.

Aspect 11 (FIGS. 24, 22, and 23A-23C)

A non-JTAG access port in a device comprising:

an access port controller that operates in response to TMS and TCKsignals according to a state diagram that is different from the standardJTAG/1149.1 test access port state diagram to output instruction anddata register control signals,

an instruction register responsive to the instruction register controlsignals to capture, shift and update instruction data, and;

a data register selectively responsive to the data register controlsignals to perform one of a capture, shift and update operation, acapture and shift operation, and a shift and update operation.

Aspect 12 (FIG. 21)

The non-JTAG access port of ASPECT 11 further comprising a bypassregister selectively responsive to the data register control signals toshift data.

Aspect 13 (FIGS. 25, 26, and 27)

A non-JTAG access port in a device comprising:

an access port controller that operates in response to TMS and TCKsignals according to a state diagram that is different from the standardJTAG/1149.1 test access port state diagram to output data registercontrol signals, and;

a data register responsive to the data register control signals toperform one of a capture, shift and update operation, a capture andshift operation, and a shift and update operation.

Aspect 14 (FIG. 28)

A non-JTAG access port in a device comprising:

an access port interface having an input connected to a TMS signal, aninput connected to a TCK signal, an input connected to an enable signal,an output connected to a load/shift (L/S) signal, and an outputconnected to a clock (CLK) signal, said access port interface couplingthe TMS signal to the load/shift signal and the TCK signal to the clocksignal when the enable input is set to a first logic level and couplingthe load/shift signal and the clock signals to static logic levels whenthe enable signal is set to a second logic level, and;

a data register having an input connected to a TDI signal, an inputconnected to the load/shift signal, an input connected to the clocksignal, parallel data input signals, parallel data output signals, and adata output signal.

Aspect 15 (FIG. 29)

A non-JTAG access port in a device comprising:

an access port interface having an input connected to a TMS signal, aninput connected to a TCK signal, an input connected to a functionalclock (FCK) signal, an input connected to an enable signal, an outputconnected to a load/shift (L/S) signal, and an output connected to aclock (CLK) signal, said access port interface coupling the TMS signalto the load/shift signal and the TCK signal to the clock signal when theenable input is set to a first logic level and coupling the load/shiftsignal to a static logic level and the clock signal to the FCK when theenable signal is set to a second logic level,

a data register having an input connected to a TDI signal, an inputconnected to the load/shift signal, an input connected to the clocksignal, parallel data input signals, parallel data output signals, and adata output signal, and;

combinational logic having inputs connected to the parallel data outputsignals and outputs connected to the parallel data input signals.

Aspect 16 (FIGS. 30 and 32)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a first access port having an input connected to the TDI input terminal,an input connected to the TMS input terminal, an input connected to theTCK input terminal, an enable input, and a data output,

a second access port having a data input, an input connected to the TMSinput terminal, an input connected to the TCK input terminal, an enableinput, and a data output,

an access port selector having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an input coupledto the TCK input terminal via an inverter, enable outputs connected tothe enable inputs of the first and second access ports, control outputs,and a data output,

a multiplexer having an input connected to the data output of the firstaccess port, an input connected to the TDI input terminal, a controlinput connected to the control outputs of the access port selector, anda data output connected to the data input of the second access port,and;

multiplexer circuitry having data inputs connected to the data outputsof the first and second access ports, control inputs connected to thecontrol outputs of the access port selector, and a data output coupledto the TDO output terminal.

Aspect 17 (FIG. 33)

A data register of an access port that is enabled by an access portselector comprising: a shift register having a TDI input, CTL inputs,parallel data outputs connected to a circuit destination, parallel datainputs connected to a circuit source, and a data output.

Aspect 18 (FIG. 34)

A data register of an access port that is enabled by an access portselector comprising: a shift register having a TDI input, CTL inputs,parallel data outputs connected to a circuit destination, and a dataoutput.

Aspect 19 (FIG. 35)

A data register of an access port that is enabled by an access portselector comprising: a shift register having a TDI input, CTL inputs,parallel data inputs connected to a circuit source, and a data output.

Aspect 20 (FIG. 36)

A data register of a device access port that is enabled by a deviceaccess port selector comprising:

a shift register having a TDI input, CTL inputs, parallel data outputs,parallel data inputs connected to a circuit source, and a data output,and;

an update register having parallel data inputs connected to the paralleldata outputs, parallel data outputs connected to a circuit destination,and CTL inputs.

Aspect 21 (FIG. 37)

A data register of a device access port that is enabled by a deviceaccess port selector comprising:

a shift register having a TDI input, CTL inputs, parallel data outputs,and a data output, and;

an update register having parallel data inputs connected to the paralleldata outputs, and CTL inputs.

Aspect 22 (FIG. 38)

A data register of a device access port that is enabled by a deviceaccess port selector comprising:

a test data decompressor (D) having a TDI input, CTL inputs, and scandata outputs,

a test data compactor circuit (C), having scan data inputs, CTL inputs,and a data output, and;

plural scan registers each having a scan data input coupled to arespective one of the scan data outputs of the test data decompressor,CTL inputs, and a scan data output coupled to a respective one of thescan data inputs of the test data compactor.

Aspect 23 (FIG. 39)

A data register of a device access port that is enabled by a deviceaccess port selector comprising:

a first device select module (DSM) having a serial input (SI) connectedto a TDI signal, CTL inputs, a data output (DO), control outputs (C), adata input (DI), and a serial output (SO),

a second device select module having a serial input connected to theserial output of the first device select module, CTL inputs, a dataoutput, control outputs, a data input, and a serial output,

a first instrument having a data input connected to the data output ofthe first device select module, control inputs connected to the controloutputs of the first device select module, and a data output connectedto the data input of the first device select module, and;

a second instrument having a data input connected to the data output ofthe second device select module, control inputs connected to the controloutputs of the second device select module, and a data output connectedto the data input of the second device select module.

Aspect 24 (FIG. 41)

An arrangement between a device containing an access port selectionarchitecture and controller for accessing the device access portselection architecture comprising:

a device having a TDI input, a TCK input, a TMS input, and a TDO output,

a controller having a TDI output, a TCK output, a TMS output, and a TDOinput, and;

a first connection between the controller TDI output and device TDIinput,

a second connection between the controller TCK output and the device TCKinput,

a third connection between the controller TMS output and the device TMSinput, and;

a fourth connection between the controller TDO input and the device TDOoutput.

Aspect 25 (FIG. 42)

An arrangement between daisy-chained devices, each containing an accessport selection architecture, and controller for accessing the deviceaccess port selection architectures comprising:

a controller having a TDI output, a TCK output, a TMS output, and a TDOinput,

a first device having a TDI input connected to the TDI output of thecontroller, a TCK input connected to the TCK output of the controller, aTMS input connected to the TMS output of the controller, and a TDOoutput, and;

a second device having a TDI input connected to the TDO output of thefirst device, a TCK input connected to the TCK output of the controller,a TMS input connected to the TMS output of the controller, and a TDOoutput coupled to the TDO input of the controller.

Aspect 26 (FIG. 43)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a first access port having an input connected to the TDI input terminal,an input connected to the TMS input terminal, an input connected to theTCK input terminal, an enable input, and a data output,

a second access port having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an inputconnected to the TCK input terminal, an enable input, and a data output,

an addressable access port selector having an input connected to the TDIinput terminal, an input connected to the TMS input terminal, an inputcoupled to the TCK input terminal via an inverter, a first enable outputconnected to the enable input of the first access port, a second enableoutput connected to the enable input of the second access port, a matchoutput, control outputs, and a data output, and;

multiplexer circuitry having a data input connected to the data outputof the first access port, a data input connected to the data output ofthe second access port, a data input connected to the data output of theaccess port selector, control inputs connected to the control outputs ofthe access port selector, and a data output coupled to the TDO outputterminal.

Aspect 27 (FIG. 43)

The electrical device of ASPECT 27 wherein the first access port is aJTAG (IEEE 1149.1 standard) test access port and the second access portis one of a JTAG compliant access port, a JTAG compatible access port,and a non-JTAG access port.

Aspect 28 (FIG. 43A)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a first access port having an input connected to the TDI input terminal,an input connected to the TMS input terminal, an input connected to theTCK input terminal, an enable input, an output enable output, and a dataoutput,

a second access port having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an inputconnected to the TCK input terminal, an enable input, an output enableoutput, and a data output,

an addressable access port selector having an input connected to the TDIinput terminal, an input connected to the TMS input terminal, an inputcoupled to the TCK input terminal via an inverter, a first enable outputconnected to the enable input of the first access port, a second enableoutput connected to the enable input of the second access port, anoutput enable output, an match output, and a data output, and;

a first tri-state buffer having a data input connected to the dataoutput of the first access port, an enable input connected to the outputenable output of the first access port, and a data output,

a second tri-state buffer having a data input connected to the dataoutput of the second access port, an enable input connected to theoutput enable output of the second access port, and a data output,

a third tri-state buffer having a data input connected to the dataoutput of the access port selector, an enable input connected to theoutput enable output of the access port selector, and a data output,and;

a fourth tri-state buffer having a data input connected to the dataoutputs of the first, second and third tri-state buffers and a dataoutput connected to the TDO output terminal.

Aspect 29 (FIG. 43A)

The electrical device of ASPECT 28 wherein the first access port is aJTAG (IEEE 1149.1 standard) test access port and the second access portis one of a JTAG compliant access port, a JTAG compatible access port,and a non-JTAG access port.

Aspect 30 (FIG. 44)

An addressable access port selector in a device for enabling access to aselected one of plural access ports in the device comprising:

an access port selector controller operable in response to an input froma TMS terminal of the device on the falling edge of a clock input from aTCK terminal of the device to output instruction and data registercontrol signals,

an instruction register responsive to the instruction register controlsignals to serially input an instruction from a TDI terminal of thedevice and to update the serially input instruction on parallel outputsof the instruction register,

a device address register selectively responsive to the data registercontrol signals to serially input address data from the TDI terminal ofthe device, comparing the input address to the address of the device,and in response to the addresses being the same, asserting a matchsignal output from the device address register, and;

an access port select register selectively responsive to the dataregister control signals to serially input port selection data from theTDI terminal of the device and to update, if the match signal isasserted, the serially input port selection data on parallel outputs ofthe access port select register.

Aspect 31 (FIG. 44)

The addressable access port selector of ASPECT 30 further comprising abypass register selectively responsive to the data register controlsignals to serially input bypass data from the TDI terminal and to passthe bypass data to a TDO terminal of the device.

Aspect 32 (FIG. 45)

A device address register comprising:

a shift register having a serial input, parallel inputs, control inputs,parallel outputs and a serial output,

a device address providing circuit having parallel outputs,

a compare circuit having first and second parallel inputs and a matchoutput,

a flip flop having a data input, a control input, and a data output,and;

connections formed between the parallel inputs of the shift register andparallel outputs of the device address providing circuit, between theparallel outputs of the shift register and the first parallel inputs ofthe compare circuit, between the parallel outputs of the device addressproviding circuit and the second parallel inputs of the compare circuit,and between the match output of the compare circuit and the data inputof the flip flop.

Aspect 33 (FIG. 46)

A port select register comprising:

a shift register having a serial input, parallel inputs, control inputs,parallel outputs and a serial output,

an update register having parallel inputs, an enable input, controlinputs, and parallel outputs, and;

connections formed between the parallel inputs of the shift register andparallel outputs of the update register, and between the paralleloutputs of the shift register and the parallel inputs of the updateregister.

Aspect 34 (FIG. 47)

An arrangement between multiple devices, each containing an addressableaccess port selection architecture, and controller for accessing thedevice's addressable access port selection architecture comprising:

a controller having a TDI output, a TCK output, a TMS output, and a TDOinput,

a first device having a TDI input connected to the TDI output of thecontroller, a TCK input connected to the TCK output of the controller, aTMS input connected to the TMS output of the controller, and a TDOoutput connected to the TDO input of the controller, and;

a second device having a TDI input connected to the TDO output of thecontroller, a TCK input connected to the TCK output of the controller, aTMS input connected to the TMS output of the controller, and a TDOoutput coupled to the TDO input of the controller.

Aspect 35 (FIG. 48)

An arrangement between multiple devices, each containing an addressableaccess port selection architecture, and controller for accessing thedevice's addressable access port selection architecture comprising:

a controller having a TDI output, a TCK output, a TMS output, and a TDOinput,

a first device having a TDI input connected to the TDI output of thecontroller, a TCK input connected to the TCK output of the controller, aTMS input connected to the TMS output of the controller, and a TDOoutput, and;

a second device having a TDI input connected to the TDO output of thefirst device, a TCK input connected to the TCK output of the controller,a TMS input connected to the TMS output of the controller, and a TDOoutput coupled to the TDO input of the controller.

Aspect 36 (FIG. 49)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a multiple mode access port having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an inputconnected to the TCK input terminal, mode inputs, and a data output,

an access port selector having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an input coupledto the TCK input terminal via an inverter, mode outputs connected to themode inputs of the multiple mode access port, a control output, and adata output, and;

a multiplexer having a data input connected to the data output of themultiple mode access port, a data input connected to the data output ofthe access port selector, a control input connected to the controloutput of the access port selector, and a data output coupled to the TDOoutput terminal.

Aspect 37 (FIG. 50)

The multiple mode access port of ASPECT 36 wherein the multiple modeaccess port operates as a JTAG test access port in response to a firstmode input pattern.

Aspect 38 (FIG. 51)

The multiple mode access port of ASPECT 36 wherein the multiple modeaccess port operates as a JTAG complaint access port in response to asecond mode input pattern.

Aspect 39 (FIG. 52)

The multiple mode access port of ASPECT 36 wherein the multiple modeaccess port operates as a JTAG compatible access port in response to athird mode input pattern.

Aspect 40 (FIG. 53)

The multiple mode access port of ASPECT 36 wherein the multiple modeaccess port operates as a non-JTAG access port in response to a fourthmode input pattern.

Aspect 41 (FIG. 54)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a multiple mode access port having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an inputconnected to the TCK input terminal, mode inputs, and output enableoutput, and a data output,

an access port selector having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an input coupledto the TCK input terminal via an inverter,

mode outputs connected to the mode inputs of the multiple mode accessport, an output enable output, and a data output,

a first tri-state buffer having a data input connected to the dataoutput of the multiple mode access port, an enable input connected tothe output enable output of the multiple mode access port, and a dataoutput,

a second tri-state buffer having a data input connected to the dataoutput of the access port selector, an enable input connected to theoutput enable output of the access port selector,

and a data output,

a third tri-state buffer having a data input connected to the dataoutputs of the first and second tri-state buffers and a data outputconnected to the TDO output terminal.

Aspect 42 (FIG. 55)

An electrical device comprising:

a TDI input terminal, TMS input terminal, TCK input terminal, and TDOoutput terminal,

a multiple mode access port having an input connected to the TDI inputterminal, an input connected to the TMS input terminal, an inputconnected to the TCK input terminal, mode inputs, and a data output,

an addressable access port selector having an input connected to the TDIinput terminal, an input connected to the TMS input terminal, an inputcoupled to the TCK input terminal via an inverter, mode outputsconnected to the mode inputs of the multiple mode access port, a controloutput, an address match output, and a data output, and;

a multiplexer having a data input connected to the data output of themultiple mode access port, a data input connected to the data output ofthe addressable access port selector, a control input connected to thecontrol output of the addressable access port selector, and a dataoutput coupled to the TDO output terminal.

Aspect 43 (FIG. 55)

The multiple mode access port of ASPECT 42 wherein the multiple modeaccess port operates as a JTAG test access port in response to a firstmode input pattern.

Aspect 44 (FIG. 55)

The multiple mode access port of ASPECT 42 wherein the multiple modeaccess port operates as a JTAG complaint access port in response to asecond mode input pattern.

Aspect 45 (FIG. 55)

The multiple mode access port of ASPECT 42 wherein the multiple modeaccess port operates as a JTAG compatible access port in response to athird mode input pattern.

Aspect 46 (FIG. 55)

The multiple mode access port of ASPECT 42 wherein the multiple modeaccess port operates as a non-JTAG access port in response to a fourthmode input pattern.

What is claimed is:
 1. An integrated circuit comprising: A. a TDI input lead, TMS input lead, TCK input lead, TDO output lead, and TRST input lead; B. a first access port having an input connected to the TDI input lead, an input connected to the TMS input lead, an input connected to the TCK input lead, an enable input, a reset input, and a data output coupled to the TDO output lead; C. a second access port having an input connected to the TDI input lead, an input connected to the TMS input lead, an input connected to the TCK input lead, an enable input, a reset input, and a data output coupled to the TDO output lead; D. an inverter having an input connected to the TCK input lead and an output; and E. an access port selector having a port select register and a state machine controller, the port select register having an input coupled to the TDI input lead, control inputs, a first enable output connected to the enable input of the first access port, and a second enable output connected to the enable input of the second access port, the state machine controller having an input coupled to the TMS input lead, an input coupled to the output of the inverter, an input coupled to the TRST lead, a reset output coupled to the reset inputs of the first access port and the second access port, and control outputs connected to the control inputs of the port select register.
 2. The integrated circuit of claim 1 in which the first test access port includes a data register, a bypass register, and an instruction register having inputs coupled to the TDI input lead, outputs coupled to the TDO output lead, and control inputs, the first test access port including a state machine controller having inputs coupled to the TMS input lead and the TCK input lead, and having control outputs connected to the data register, bypass register, and instruction register.
 3. The integrated circuit of claim 1 in which the second test access port includes a data register, a bypass register, and an instruction register having inputs coupled to the TDI input lead, outputs coupled to the TDO output lead, and control inputs, the second test access port including a state machine controller having inputs coupled to the TMS input lead and the TCK input lead, and having control outputs connected to the data register, bypass register, and instruction register.
 4. The integrated circuit of claim 1 in which the first test access port includes a data register, a bypass register, and an instruction register having inputs coupled to the TDI input lead, outputs coupled to the TDO output lead, and control inputs, the first test access port including a state machine controller having inputs coupled to the TMS input lead and the TCK input lead, and having control outputs connected to the data register, bypass register, and instruction register, the state machine controller having the states of TEST LOGIC RESET, RUN TEST/IDLE, SELECT-DR, CAPTURE-DR, SHIFT-DR, EXIT1-DR, PAUSE-DR, EXIR2-DR, and UPDATE-DR.
 5. The integrated circuit of claim 1 in which the second test access port includes a data register, a bypass register, and an instruction register having inputs coupled to the TDI input lead, outputs coupled to the TDO output lead, and control inputs, the second test access port including a state machine controller having inputs coupled to the TMS input lead and the TCK input lead, and having control outputs connected to the data register, bypass register, and instruction register, the state machine controller having the states of TEST LOGIC RESET, RUN TEST/IDLE, SELECT-DR, CAPTURE-DR, SHIFT-DR, EXIT1-DR, PAUSE-DR, EXIR2-DR, and UPDATE-DR. 